{"product_id":"high-performance-memory-testing-design-principles-fault-modeling-and-self-test-frontiers-in-electronic-testing-22a","title":"High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)","description":"Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.\nHigh Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.\nHigh Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.\u003cbr\u003eASIN: 1402072554\u003cbr\u003eVSKU: BVV.1402072554.VG\u003cbr\u003eCondition: Very Good\u003cbr\u003eAuthor\/Artist:Adams, R. Dean\u003cbr\u003eBinding: Hardcover\u003cbr\u003e\u003cb\u003eNote:\u003c\/b\u003e Any images shown are stock photographs and product may differ from what is shown.  \u003cbr\u003e\u003cb\u003eCondition Notes\u003c\/b\u003e: Book has little sign of wear or use  \u003cbr\u003e","brand":"Blue Vase Books","offers":[{"title":"Default Title","offer_id":43524187979837,"sku":"BVV.1402072554.VG","price":87.41,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0589\/4225\/9261\/files\/1402072554-0.jpg?v=1787867125","url":"https:\/\/www.bluevasebooks.com\/products\/high-performance-memory-testing-design-principles-fault-modeling-and-self-test-frontiers-in-electronic-testing-22a","provider":"Blue Vase Books","version":"1.0","type":"link"}