Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader. Contents - Preface - Introduction - Fourier integral representation of an optical image - Sampled imager response function - Sampled imager design and optimization - Interlace and Dither - Dynamic Sampling, Resolution Enhancement, and Super-Resolution - The Sampling Theorem - Laboratory Measurements of Sampled Infrared Imaging System Performance - Appendix A: Fourier integrals and Fourier series - Appendix B: The impulse function
ASIN: 0819434892
VSKU: BVV.0819434892.G
Condition: Good
Author/Artist:Vollmerhausen, Richard H.|Driggers, Ronald G.
Binding: Paperback
Note: Any images shown are stock photographs and product may differ from what is shown.
Condition Notes: The item shows wear from consistent use, but it remains in good condition and works perfectly. All pages and cover are intact including the dust cover, if applicable . Spine may show signs of wear. Pages may include limited notes and highlighting. May NOT include discs, access code or other supplemental materials.