High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
ASIN: 1402072554
VSKU: BVV.1402072554.VG
Condition: Very Good
Author/Artist:Adams, R. Dean
Binding: Hardcover
Note: Any images shown are stock photographs and product may differ from what is shown.
Condition Notes: Book has little sign of wear or use